Atomic Force Microscope
Coulomat 702 SO/CS
Electrochemical filter-press reactor
Electrochemical measurements combined with xyz translation stage
Flame Atomic Absorption Spectroscopy (SpectrAA 220 Fast Sequential)
Impact fretting (MODE II)
Inductively Coupled Plasma Atomic Emission Spectroscopy (Liberty series II)
Microprobe ARL SEM-Q 34
Nano/Micro-Hardness Tester CSM
Scanning Reference Electrode technique
Surface Profilometry: contact and non-contact instruments
Surface Profilometry: Wyko NT3300
Tribology: Fretting/reciprocating sliding test equipment (MODE I)
Tribology: Pin/Ball-on-disk test equipment
XRF spectrometer Philips PW 2400
XRF thickness measurement system Veeco 300-AT
