Physical equipment: Transmission Electron Microscope

Transmission Electron Microscope JEM-200 CX JEOL

Description:
The JEM-200 CX is a high performance transmission electron microscope. The basic instrument is expanded with two additional extensions namely a scanning attachment and a energy dispersive X-ray spectrometer, thus enabling the operator to perform a wide range of measurements.
Start-up, shutdown and photography can be executed by a simple pushbutton operation. Magnification and camera length can by directly read out regardless of any change in the accelerating voltage, and recorded together with the film number on the film. The focus, once set, almost never requires readjustment because it compensates for change in the accelerating voltage and magnification. However, if required, correct focussing can be obtained using an image wobbler device. Moreover, this microscope provides very stable and excellent bright field - as well as dark field images at low to high magnifications and a variety of electron diffraction patters instantly.

Technical details:
Microscope
Guaranteed resolution 0.14 nm lattice
0.35 nm point to point
Accelerating voltage 80, 100, 120, 160, 200 kV
Magnification
Standard
Selected area
Low magnification 600 x - 450000 x
6000 x - 120000 x
100 x - 600 x
Electron diffraction camera length
Selected area
High dispersion
High resolution 160 - 2330 mm
3.4 - 55 mm
312 mm
Thermionic electron gun, pre-centred tungsten hairpin filament
Apertures
Condenser lens
Objective lens
Field limiting 20, 200, 300, 400 µm
20, 40, 60, 120 µm
20, 80, 250, 1000 µm
Specimen
Diameter 3 mm
Stage X and Y direction 1 mm
Z direction 0.5 mm
Holders single tilt holder
double tilt holder
tilt-rotation holder
Be-double tilt holder
Scanning attachment EM-ASID 3D Jeol
Resolution
STEM image
SEM image 0.25 nm
0.40 nm
Magnification
STEM
SEM 300 x - 800000 x
10 x - 800000 x
Detectors secondary electron detector
transmitted electron detector
back-scattered electron detector
EDS X-ray spectrometer
Be-window
Diameter
Resolution FWHM 10 mm
141 eV

Room: 00.02

More Technical information: Techinfo@mtm.kuleuven.ac.be


Technical details:
Microscope
	Guaranteed resolution		0.14 nm lattice 0.35 nm point to point
	Accelerating voltage		80, 100, 120, 160, 200 kV
	Magnification
		Standard Selected area Low magnification	600 x - 450000 x 6000 x - 120000 x 100 x - 600 x
	Electron diffraction camera length
		Selected area High dispersion High resolution	160 - 2330 mm 3.4 - 55 mm 312 mm
	Thermionic electron gun, pre-centred tungsten hairpin filament
	Apertures
		Condenser lens Objective lens Field limiting	20, 200, 300, 400 µm 20, 40, 60, 120 µm 20, 80, 250, 1000 µm
	Specimen
		Diameter	3 mm
		Stage	X and Y direction 1 mm Z direction 0.5 mm
		Holders	single tilt holder double tilt holder tilt-rotation holder Be-double tilt holder
Scanning attachment EM-ASID 3D Jeol
	Resolution
		STEM image SEM image	0.25 nm 0.40 nm
	Magnification
		STEM SEM	300 x - 800000 x 10 x - 800000 x
	Detectors		secondary electron detector transmitted electron detector back-scattered electron detector
EDS X-ray spectrometer
	Be-window
		Diameter Resolution FWHM	10 mm 141 eV