The internal structure of materials.
Microfocus Computer Tomography.
To identify and quantify internal damage and internal structures
and to evaluate the production processes of advanced materials.
X-ray intensity profile measurements are computer processed by
means of reconstruction algorithms to produce an image representing
a two-dimensional slice, or plane, through the material or part
investigated with X-rays. Importantly, each point of the slice
corresponds to the material density. A high-resolution image may
be reconstructed and defects/details in the order of 10 µm can
be detected with microfocus computer tomography.
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| Images of contiguous planes can be stacked to form a three-dimensional
(3D)-image of a section, or, if the entire part has been scanned,
a full volumetric image can be performed. From these 3D-image
data, special application software can be developed to find
part boundaries and create CAD models of the entire part or
portions thereof. |
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Besides the support for manufacturing operations (CAD,CAM,CAE)
the computer tomography technology can also provide quantitative
non-destructive data for defect or structural characterization.
For the latter the micro-CT is implemented within the research
on light-metals, plastics, ceramics and their composites, for
microelectronic devices, to characterise the porosity/permeability
and internal structure of hydrocarbons (oil and gas) reservoir
rocks, for archaeological findings, medical applications and argicultural
research.
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