The internal structure of materials.

Microfocus Computer Tomography.

To identify and quantify internal damage and internal structures and to evaluate the production processes of advanced materials.

X-ray intensity profile measurements are computer processed by means of reconstruction algorithms to produce an image representing a two-dimensional slice, or plane, through the material or part investigated with X-rays. Importantly, each point of the slice corresponds to the material density. A high-resolution image may be reconstructed and defects/details in the order of 10 µm can be detected with microfocus computer tomography.

Tomography

Images of contiguous planes can be stacked to form a three-dimensional (3D)-image of a section, or, if the entire part has been scanned, a full volumetric image can be performed. From these 3D-image data, special application software can be developed to find part boundaries and create CAD models of the entire part or portions thereof. koraal.jpg (7086 bytes)

Besides the support for manufacturing operations (CAD,CAM,CAE) the computer tomography technology can also provide quantitative non-destructive data for defect or structural characterization. For the latter the micro-CT is implemented within the research on light-metals, plastics, ceramics and their composites, for microelectronic devices, to characterise the porosity/permeability and internal structure of hydrocarbons (oil and gas) reservoir rocks, for archaeological findings, medical applications and argicultural research.

Take a look at the µCT equipment : SkyScan 1072 system
  AEA Tomohawk system

Downloads


Presentations from the seminars :

X-ray microfocus computed tomography in materials research

 

 

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Last modified: 25-09-2009

     
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