is a
versatile software package for the simulation of electron diffraction contrast
images of localized strain.
Electron diffraction contrast imaging allows for the characterization of
localized strain with micrometer to nanometer resolution.
SIMCON was developed at
MTM and
IMEC as a part of the
PhD research of Koenraad Janssens.
SIMCON IS FREEWARE FOR NON-COMMERCIAL USE ONLY. SIMCON or any part of it MAY NOT be sold nor may it be included into any commercial product without prior and written agreement of the author (Koenraad G. F. Janssens) or the institutes where it has been developed (MTM or IMEC).
When publishing images or results based on simulations made by SIMCON please include something like "These images were simulated using the SIMCON software developed by Janssens et al [Ref.Nr.]", where the following article is cited: "Koenraad G.F. Janssens, Jan Vanhellemont, Marc De Graef and Omer Van der Biest, "SIMCON: a versatile software package for the simulation of electron diffraction contrast images of arbitrary displacement fields", Ultramicroscopy 45 (1992) pp.323-335".
Using SIMCON implies that you have read and accept this note.
Although the source code is compilable on most platforms, slight modifications are sometimes necessary. Here is an alternate version I've already set up myself:
If you adapt the program for other platforms please let me know whether you wish me to make this list more complete. That is if you want other potential users to benefit from your efforts ...
If you wish you can register your copy by mailing your coordinates to the simcon address below. The only purpose is to let you know if and when changes are made to the simcon source code.